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FET & MOSFET (Electronics Engineering) Solved Questions & Notes (2026) - Apex Rankers

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FET & MOSFET

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Q. 1 Electronics Engineering
Difficulty: Easy (1 Mark)
A Field Effect Transistor (FET) differs fundamentally from a BJT because a FET is a:
A
Unipolar, voltage-controlled device where current conduction is mediated solely by majority carriers
✓ Correct
B
Bipolar, current-controlled device
C
Device with very low input impedance
D
Device that cannot amplify high frequencies
💡 Step-by-Step Explanation & Concept Rationale
BJTs are current-controlled and involve both majority and minority carriers (bipolar). FETs are voltage-controlled (gate voltage VGS modulates channel conductivity) and current flows via only one carrier type (electrons in N-channel, holes in P-channel), making them unipolar with ultra-high input impedance.
Q. 2 Electronics Engineering
Difficulty: Easy (1 Mark)
The input impedance of a Junction Field Effect Transistor (JFET) gate is exceptionally high (typically 10^8 to 10^10 ohms) because:
A
The Gate-to-Source PN junction is always operated under reverse bias
✓ Correct
B
The gate is made of thick gold
C
The channel is insulated by air
D
The drain is grounded
💡 Step-by-Step Explanation & Concept Rationale
Under normal operation, the gate-channel PN junction is reverse-biased (VGS <= 0 for N-channel JFET). Only tiny reverse leakage current (nanoamperes) flows, yielding input resistance in hundreds of megaohms.
Q. 3 Electronics Engineering
Difficulty: Medium (1 Mark)
In an N-channel JFET, the Pinch-off Voltage (Vp) is the value of drain-to-source voltage (VDS) at which:
A
The depletion layers touch across the channel, causing drain current to saturate at a constant maximum value (IDSS) for VGS = 0
B
The gate junction breaks down irreversibly
✓ Correct
C
Drain current drops to zero
D
The device acts as an open circuit
💡 Step-by-Step Explanation & Concept Rationale
At pinch-off (VDS = |Vp|), the reverse bias at the drain end of the channel narrows the conductive channel to a constant constricted constriction. Electrons are swept through by the electric field, keeping drain current saturated and constant at IDSS (saturation/active region).
Q. 4 Electronics Engineering
Difficulty: Easy (1 Mark)
Shockley's equation for the drain current ID of a JFET in the saturation (pinch-off) region is:
A
ID = IDSS * [1 - (VGS / Vp)]^2
✓ Correct
B
ID = IDSS * [1 - (VGS / Vp)]
C
ID = IDSS * (VGS / Vp)^2
D
ID = beta * VGS
💡 Step-by-Step Explanation & Concept Rationale
Shockley's transfer equation states: ID = IDSS * [1 - (VGS / Vp)]^2, where IDSS is maximum drain current with VGS = 0, and Vp is pinch-off voltage (gate-source cutoff voltage VGS_off). It exhibits a non-linear square-law transfer characteristic.
Q. 5 Electronics Engineering
Difficulty: Medium (1 Mark)
The transconductance (gm) of a JFET operating in saturation is mathematically derived as:
A
gm = gm0 * [1 - (VGS / Vp)], where gm0 = 2 * IDSS / |Vp|
✓ Correct
B
gm = IDSS / Vp
C
gm = Vp / IDSS
D
gm = 2 * IDSS * VGS
💡 Step-by-Step Explanation & Concept Rationale
Differentiating Shockley's equation with respect to VGS gives: gm = dID / dVGS = [2 * IDSS / |Vp|] * [1 - (VGS / Vp)] = gm0 * [1 - (VGS / Vp)]. Maximum transconductance gm0 occurs at VGS = 0.
Q. 6 Electronics Engineering
Difficulty: Medium (1 Mark)
In the ohmic (triode) region where VDS < (VGS - Vp), a JFET behaves as a:
A
Voltage-Controlled Resistor (VCR) whose channel resistance is modulated by gate voltage VGS
✓ Correct
B
Constant current source
C
High-frequency diode detector
D
Negative resistance oscillator
💡 Step-by-Step Explanation & Concept Rationale
At low VDS prior to pinch-off, drain current varies linearly with VDS: rDS = ro / [1 - (VGS / Vp)]. The JFET functions as a linear Voltage-Controlled Resistor, widely used in automatic gain control (AGC) circuits and analog multipliers.
Q. 7 Electronics Engineering
Difficulty: Easy (1 Mark)
A MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) has an input impedance significantly higher than a JFET (up to 10^12 to 10^14 ohms) because:
A
The metallic gate electrode is completely physically and electrically isolated from the semiconductor channel by an ultra-thin silicon dioxide (SiO2) dielectric layer
✓ Correct
B
The gate PN junction has zero leakage
C
It operates in liquid nitrogen
D
Electrons cannot cross silicon
💡 Step-by-Step Explanation & Concept Rationale
The gate in a MOSFET is insulated by a thin layer of SiO2 (dielectric insulator with resistance > 10^14 ohms). Gate DC leakage current is virtually zero (picoamperes), giving it the highest input impedance of all solid-state transistors.
Q. 8 Electronics Engineering
Difficulty: Easy (1 Mark)
An Enhancement-mode MOSFET (E-MOSFET) is classified as a 'normally-off' device because:
A
No physical conductive channel exists at VGS = 0; current cannot flow until gate voltage exceeds a positive Threshold Voltage (VGS > Vth) to create an inversion layer
✓ Correct
B
It requires negative gate bias to conduct
C
The channel is permanently depleted
D
The source is disconnected
💡 Step-by-Step Explanation & Concept Rationale
In an N-channel E-MOSFET, the substrate between N+ source and drain is P-type. At VGS = 0, back-to-back PN junctions block current. Applying VGS > Vth attracts electrons to the surface, creating an N-type 'inversion layer' (channel). It is standard for digital logic.
Q. 9 Electronics Engineering
Difficulty: Medium (1 Mark)
A Depletion-mode MOSFET (D-MOSFET) differs from an E-MOSFET because:
A
It has a physically fabricated channel and can operate in both Depletion mode (negative VGS) and Enhancement mode (positive VGS)
✓ Correct
B
It cannot conduct current under positive gate bias
C
It has zero breakdown voltage
D
It has no gate insulator
💡 Step-by-Step Explanation & Concept Rationale
D-MOSFETs have a built-in physical channel. Applying negative VGS depletes the channel of electrons (depletion mode), while applying positive VGS attracts more electrons, enhancing channel conductivity (enhancement mode).
Q. 10 Electronics Engineering
Difficulty: Medium (1 Mark)
The drain current equation for an N-channel E-MOSFET in its saturation (active) region is given by:
A
ID = k * (VGS - Vth)^2 = (1/2) * mu_n * Cox * (W / L) * (VGS - Vth)^2
✓ Correct
B
ID = k * (VGS - Vth)
C
ID = IDSS * (1 - VGS/Vth)
D
ID = VDS / (VGS - Vth)
💡 Step-by-Step Explanation & Concept Rationale
In saturation [VDS >= (VGS - Vth)], drain current follows square-law dependence: ID = (1/2) * k_n' * (W/L) * (VGS - Vth)^2, where Cox is gate oxide capacitance per unit area, and W/L is the transistor aspect ratio.
Q. 11 Electronics Engineering
Difficulty: Hard (1 Mark)
In deep sub-micron MOSFETs, Channel Length Modulation refers to:
A
The reduction in effective channel length (L_eff = L - delta_L) as pinch-off moves toward the source with increasing VDS, causing a finite output resistance (ro)
✓ Correct
B
Mechanical stretching of the gate
C
Thermal drift of the threshold voltage
D
The effect of source degeneration
💡 Step-by-Step Explanation & Concept Rationale
Analogous to the Early Effect in BJTs, as VDS increases beyond saturation, the pinch-off point moves inward toward the source, shortening effective channel length. This increases drain current slightly: ID = ID_sat * (1 + lambda * VDS), where lambda is the channel-length modulation parameter.
Q. 12 Electronics Engineering
Difficulty: Hard (1 Mark)
The Body Effect (substrate bias effect) in a MOSFET causes:
A
An increase in threshold voltage (Vth) when the source-to-body junction is reverse-biased (VSB > 0)
✓ Correct
B
A decrease in gate capacitance
C
Zero drain current under all conditions
D
Excessive gate leakage
💡 Step-by-Step Explanation & Concept Rationale
When source-to-substrate voltage VSB > 0, the depletion layer between channel and substrate widens, exposing more bulk acceptor ions. A larger gate voltage is required to invert the channel, shifting threshold voltage: delta_Vth = gamma * [sqrt(2*phi_F + VSB) - sqrt(2*phi_F)].
Q. 13 Electronics Engineering
Difficulty: Easy (1 Mark)
Why are N-channel MOSFETs (NMOS) faster and physically smaller than P-channel MOSFETs (PMOS) of identical current rating?
A
Electron mobility in silicon (mu_n ≈ 1350 cm^2/V-s) is 2.5 to 3 times higher than hole mobility (mu_p ≈ 480 cm^2/V-s)
✓ Correct
B
NMOS operates at higher voltage
C
PMOS requires thicker oxide
D
Holes travel at the speed of light
💡 Step-by-Step Explanation & Concept Rationale
Because carrier mobility for electrons is ~3 times greater than for holes, an NMOS transistor has roughly 3 times higher transconductance and drain current for the same W/L aspect ratio. To match NMOS drive strength in CMOS gates, PMOS width Wp must be designed 2 to 3 times wider than Wn.
Q. 14 Electronics Engineering
Difficulty: Easy (1 Mark)
A basic CMOS (Complementary MOS) inverter consists of:
A
One PMOS pull-up transistor connected to VDD and one NMOS pull-down transistor connected to GND, with gates tied together as input
✓ Correct
B
Two identical NMOS transistors in series
C
A BJT and a JFET in cascode
D
Two PMOS transistors in parallel
💡 Step-by-Step Explanation & Concept Rationale
CMOS logic combines complementary N-channel and P-channel enhancement MOSFETs. When input is HIGH (logic 1), NMOS conducts and PMOS is OFF (output = 0). When input is LOW (logic 0), PMOS conducts and NMOS is OFF (output = 1). In either steady state, one transistor is completely OFF.
Q. 15 Electronics Engineering
Difficulty: Easy (1 Mark)
The primary technological advantage of CMOS logic over NMOS or TTL logic is:
A
Virtually zero static DC power dissipation, because no direct DC current path exists between VDD and GND in steady-state
✓ Correct
B
Extremely high static power consumption
C
Ability to withstand 1000 V spikes without protection
D
Elimination of dynamic charging currents
💡 Step-by-Step Explanation & Concept Rationale
Because one transistor is always non-conducting in steady-state, static current is limited to minute leakage (nanoamperes). Power is consumed almost entirely during digital switching transitions (dynamic power: P_dyn = C * VDD^2 * f), making CMOS optimal for VLSI processors.
Q. 16 Electronics Engineering
Difficulty: Hard (1 Mark)
The phenomenon of 'Latch-up' in CMOS integrated circuits refers to:
A
Accidental triggering of parasitic cross-coupled NPN-PNP bipolar transistors (forming a parasitic SCR thyristor) between VDD and GND, causing destructive short-circuit currents
✓ Correct
B
Clock synchronization failure
C
Permanent gate oxide breakdown
D
Loss of threshold voltage at cold temperatures
💡 Step-by-Step Explanation & Concept Rationale
CMOS structures naturally create parasitic vertical PNP and lateral NPN bipolar transistors forming a p-n-p-n thyristor structure. Voltage spikes or ionizing radiation can trigger regenerative regenerative latch-up, creating a low-impedance short between power rails that destroys the IC unless guard rings and substrate taps are placed.
Q. 17 Electronics Engineering
Difficulty: Easy (1 Mark)
Why must discrete MOSFET devices and CMOS ICs be handled with grounded wrist straps and conductive anti-static bags?
A
Their extremely thin SiO2 gate oxide layer (few nanometers thick) can be easily punctured and destroyed by electrostatic discharge (ESD) voltages exceeding 50-100 V
✓ Correct
B
They are radioactive
C
They demagnetize when touched
D
Static charges reverse the doping concentration
💡 Step-by-Step Explanation & Concept Rationale
The gate oxide is extraordinarily thin (breakdown electric field ~10 MV/cm, equivalent to < 20-50 V across a 20 nm gate). Human static charges easily exceed thousands of volts, causing instantaneous dielectric rupture unless ESD protection clamps are in place.
Q. 18 Electronics Engineering
Difficulty: Medium (1 Mark)
A Transmission Gate (analog bilateral switch) in CMOS circuits is formed by connecting:
A
An NMOS and a PMOS transistor in parallel, controlled by complementary gate enable signals
✓ Correct
B
Two NMOS transistors in series
C
A diode bridge in series with an inductor
D
Two cross-coupled inverters
💡 Step-by-Step Explanation & Concept Rationale
An NMOS passes a strong '0' but a degraded '1' (due to Vth loss); a PMOS passes a strong '1' but a degraded '0'. Connecting NMOS and PMOS in parallel with complementary clock signals (CLK and CLK_bar) passes full rail-to-rail analog voltages (0 to VDD) bidirectionally without threshold loss.
Q. 19 Electronics Engineering
Difficulty: Hard (1 Mark)
The Drain-induced Barrier Lowering (DIBL) effect in short-channel MOSFETs results in:
A
A reduction in threshold voltage Vth as drain voltage VDS increases, leading to loss of gate control and increased subthreshold leakage
✓ Correct
B
An increase in gate oxide thickness
C
Zero transconductance
D
Thermal shutdown
💡 Step-by-Step Explanation & Concept Rationale
In short-channel devices (channel length < 100 nm), high drain voltage VDS creates a large depletion region that reaches close to the source, lowering the electrostatic potential barrier for electrons without gate assistance, causing subthreshold leakage current to surge.
Q. 20 Electronics Engineering
Difficulty: Medium (1 Mark)
In power electronics, why do Power MOSFETs have a positive temperature coefficient of on-resistance (RDS_on)?
A
Lattice scattering increases with temperature, decreasing electron mobility, which naturally prevents thermal runaway and allows easy parallel operation
✓ Correct
B
Carrier generation causes negative resistance
C
Oxide thickness increases with heat
D
Gate current increases exponentially
💡 Step-by-Step Explanation & Concept Rationale
Unlike BJTs (which have a negative temp coefficient leading to hot-spot current hogging), Power MOSFETs have positive temp coefficient: hotter transistors exhibit higher RDS_on, naturally shedding current to cooler parallel devices, making paralleling inherently safe.
Q. 21 Electronics Engineering
Difficulty: Easy (1 Mark)
An Insulated Gate Bipolar Transistor (IGBT) combines the advantages of which two semiconductor devices?
A
The high input impedance and simple voltage-controlled gate of a MOSFET with the low forward conduction on-state voltage drop of a power BJT
✓ Correct
B
A JFET and a Zener diode
C
A SCR and a TRIAC
D
A vacuum tube and a phototransistor
💡 Step-by-Step Explanation & Concept Rationale
An IGBT possesses a MOS gate structure driving an internal bipolar p-n-p-n structure. It requires minimal gate drive power like a MOSFET, while its conductivity modulation in the drift region yields low on-state voltage drop (VCE_sat) like a BJT, dominating medium-to-high power inverters (up to 6.5 kV).
Q. 22 Electronics Engineering
Difficulty: Hard (1 Mark)
A major switching limitation of an IGBT during turn-off is the 'Current Tail' caused by:
A
Slow recombination of minority carriers stored in the wide, floating N-drift base region
✓ Correct
B
High gate oxide capacitance
C
Snubber diode forward recovery
D
Thermal resistance of the heat sink
💡 Step-by-Step Explanation & Concept Rationale
When gate voltage drops below threshold, the internal MOSFET channel closes immediately. However, minority carriers trapped in the open base of the internal PNP transistor must recombine naturally without an external base terminal, producing a persistent current tail that increases turn-off switching losses.
Q. 23 Electronics Engineering
Difficulty: Medium (1 Mark)
In a Common Source (CS) JFET amplifier with an unbypassed source resistor RS, the voltage gain is given by:
A
Av = -gm * RD / (1 + gm * RS)
✓ Correct
B
Av = -gm * RD
C
Av = gm * RS
D
Av = -RD / RS
💡 Step-by-Step Explanation & Concept Rationale
The unbypassed source resistor RS introduces negative current-series feedback. Small signal analysis yields Av = -gm * RD / (1 + gm * RS). When RS is bypassed by a source capacitor CS, Av restores to -gm * RD.
Q. 24 Electronics Engineering
Difficulty: Hard (1 Mark)
FinFET (3D Fin Field Effect Transistor) architecture was introduced in modern advanced semiconductor nodes (< 22 nm) primarily to:
A
Wrap the conductive gate around three sides of a thin vertical silicon fin channel, providing superior electrostatic gate control that suppresses short-channel effects and subthreshold leakage
✓ Correct
B
Operate at 100 V supply rails
C
Replace copper interconnects with optical waveguides
D
Eliminate the need for lithography
💡 Step-by-Step Explanation & Concept Rationale
In planar MOSFETs below 22 nm, short-channel effects cause severe subthreshold leakage. FinFET's 3D fin wrapped by the gate on three sides provides tight electrostatic containment of the channel, drastically reducing off-state leakage and allowing scaling down to 3 nm.
Q. 25 Electronics Engineering
Difficulty: Hard (1 Mark)
High Electron Mobility Transistors (HEMT / MODFET) fabricated from GaN or GaAs heterostructures achieve ultra-high microwave switching frequencies because:
A
Electrons accumulate in an undoped potential well forming a Two-Dimensional Electron Gas (2DEG), moving with extraordinary mobility free from ionized impurity scattering
✓ Correct
B
They use liquid mercury channels
C
They have zero gate capacitance
D
Gate oxide thickness is zero
💡 Step-by-Step Explanation & Concept Rationale
By spatially separating donor dopants from the conductive channel using an AlGaN/GaN heterojunction, a 2DEG sheet of electrons is formed. Without impurity collision scattering, electron mobility exceeds 2000 cm^2/V-s, enabling amplification at tens to hundreds of gigahertz in radar and 5G base stations.
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